Application of Electrostatic Force Microscopy on Characterizing an Electret Fiber: Effect of Tip to Specimen Distance on Phase Shift
Vol. 12, No. 1, pp. 89-89, Jan. 2011
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Cite this article
[IEEE Style]
J. Kim, J. P. Hinestroza, W. Jasper, R. L. Barker, "Application of Electrostatic Force Microscopy on Characterizing an Electret Fiber: Effect of Tip to Specimen Distance on Phase Shift," Fibers and Polymers, vol. 12, no. 1, pp. 89-89, 2011. DOI: fipo-2011-12-1-89.
[ACM Style]
J. Kim, J. P. Hinestroza, W. Jasper, and R. L. Barker. 2011. Application of Electrostatic Force Microscopy on Characterizing an Electret Fiber: Effect of Tip to Specimen Distance on Phase Shift. Fibers and Polymers, 12, 1, (2011), 89-89. DOI: fipo-2011-12-1-89.