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Vol. 15, No. 5, pp. 47-58,
10월.
2005
10.13089/JKIISC.2005.15.5.47, Full Text:
Keywords: Smart Cards, COS, trapdoor, Timing Analysis, Simple Power Analysis
Abstract Statistics
Cite this article
10.13089/JKIISC.2005.15.5.47, Full Text:
Keywords: Smart Cards, COS, trapdoor, Timing Analysis, Simple Power Analysis
Abstract Statistics
Cite this article
[IEEE Style]
L. J. Youp, J. Eun-A, J. S. Won, "A New Method for Detecting Trapdoors in Smart Cards with Timing and Power Analysis," Journal of The Korea Institute of Information Security and Cryptology, vol. 15, no. 5, pp. 47-58, 2005. DOI: 10.13089/JKIISC.2005.15.5.47.
[ACM Style]
Lee Jung Youp, Jun Eun-A, and Jung Seok Won. 2005. A New Method for Detecting Trapdoors in Smart Cards with Timing and Power Analysis. Journal of The Korea Institute of Information Security and Cryptology, 15, 5, (2005), 47-58. DOI: 10.13089/JKIISC.2005.15.5.47.