오류주입공격에 대한 개선된 이중모드 레이저 프로빙 시스템
Vol. 24, No. 3, pp. 453-460,
6월.
2014
10.13089/JKIISC.2014.24.3.453, Full Text:
Keywords: Fault injection attack, Laser Probe, Side-Channel Attack, Fault Analysis Tools
Abstract Statistics
Cite this article
10.13089/JKIISC.2014.24.3.453, Full Text:
Keywords: Fault injection attack, Laser Probe, Side-Channel Attack, Fault Analysis Tools
Abstract Statistics
Cite this article
[IEEE Style]
Y. S. Lee and T. Non, "An Improved Dual-mode Laser Probing System for Fault Injecton Attack," Journal of The Korea Institute of Information Security and Cryptology, vol. 24, no. 3, pp. 453-460, 2014. DOI: 10.13089/JKIISC.2014.24.3.453.
[ACM Style]
Young Sil Lee and Thiranant Non. 2014. An Improved Dual-mode Laser Probing System for Fault Injecton Attack. Journal of The Korea Institute of Information Security and Cryptology, 24, 3, (2014), 453-460. DOI: 10.13089/JKIISC.2014.24.3.453.