Key Recovery Algorithm for Randomly-Decayed AES Key Bits
Vol. 26, No. 2, pp. 327-334,
Apr.
2016
10.13089/JKIISC.2016.26.2.327, Full Text:
Keywords: Cold Boot Attack, Side-Channel Attack, NIST Randomness Test, AES
Abstract Statistics
Cite this article
10.13089/JKIISC.2016.26.2.327, Full Text:
Keywords: Cold Boot Attack, Side-Channel Attack, NIST Randomness Test, AES
Abstract Statistics
Cite this article
[IEEE Style]
Y. Baek, "Key Recovery Algorithm for Randomly-Decayed AES Key Bits," Journal of The Korea Institute of Information Security and Cryptology, vol. 26, no. 2, pp. 327-334, 2016. DOI: 10.13089/JKIISC.2016.26.2.327.
[ACM Style]
Yoo-Jin Baek. 2016. Key Recovery Algorithm for Randomly-Decayed AES Key Bits. Journal of The Korea Institute of Information Security and Cryptology, 26, 2, (2016), 327-334. DOI: 10.13089/JKIISC.2016.26.2.327.