랜덤하게 변형된 AES 키 비트열에 대한 키 복구 알고리즘
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백유진,
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Keywords: Cold Boot Attack, Side-Channel Attack, NIST Randomness Test, AES
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Cite this article
[IEEE Style]
Y. Baek, "Key Recovery Algorithm for Randomly-Decayed AES Key Bits," Journal of The Korea Institute of Information Security and Cryptology, vol. 26, no. 2, pp. 327-334, 2016. DOI: 10.13089/JKIISC.2016.26.2.327.
[ACM Style]
Yoo-Jin Baek. 2016. Key Recovery Algorithm for Randomly-Decayed AES Key Bits. Journal of The Korea Institute of Information Security and Cryptology, 26, 2, (2016), 327-334. DOI: 10.13089/JKIISC.2016.26.2.327.