유도대전소자모델(FCDM)을 이용한 ESD에 의한 반도체소자의 손상 메커니즘 해석
Vol. 16, No. 2, pp. 57-62, Jun. 2001
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Cite this article
[IEEE Style]
김두현 and 김상렬, "유도대전소자모델(FCDM)을 이용한 ESD에 의한 반도체소자의 손상 메커니즘 해석," Journal of the Korean Society of Safety, vol. 16, no. 2, pp. 57-62, 2001. DOI: .
[ACM Style]
김두현 and 김상렬. 2001. 유도대전소자모델(FCDM)을 이용한 ESD에 의한 반도체소자의 손상 메커니즘 해석. Journal of the Korean Society of Safety, 16, 2, (2001), 57-62. DOI: .