Evaluation of Performance and Reliability of a White Organic Light-Emitting Diode(WOLED) Using an Accelerated Life Test(ALT)
Vol. 27, No. 4, pp. 13-19, Aug. 2012
-
white organic light-emitting diode(WOLED) accelerated life test(ALT) brightness deterioration dielectric tangent margin
Statistics
Cumulative Counts from November, 2022
Multiple requests among the same browser session are counted as one view. If you mouse over a chart, the values of data points will be shown.
Multiple requests among the same browser session are counted as one view. If you mouse over a chart, the values of data points will be shown.
|
|
Cite this article
[IEEE Style]
문진철, 박형기, 최충석, "Evaluation of Performance and Reliability of a White Organic Light-Emitting Diode(WOLED) Using an Accelerated Life Test(ALT)," Journal of the Korean Society of Safety, vol. 27, no. 4, pp. 13-19, 2012. DOI: .
[ACM Style]
문진철, 박형기, and 최충석. 2012. Evaluation of Performance and Reliability of a White Organic Light-Emitting Diode(WOLED) Using an Accelerated Life Test(ALT). Journal of the Korean Society of Safety, 27, 4, (2012), 13-19. DOI: .