스마트미터의 신뢰성 및 안전성 향상을 위한 TPM 관련 평가인증 제도 분석
The Korea Institute of Information Security and Cryptology,
Vol. 20, No. 5, pp. 48-55,
10월.
2010
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Cite this article
[IEEE Style]
K. Lee, D. Won, S. Kim, "nan," The Korea Institute of Information Security and Cryptology, vol. 20, no. 5, pp. 48-55, 2010.
[ACM Style]
Kwang-Woo Lee, Dong-Ho Won, and Seung-Joo Kim. 2010. nan. The Korea Institute of Information Security and Cryptology, 20, 5, (2010), 48-55.