Characterizing Yarn Thickness Variation by Correlograms
Vol. 6, No. 1, pp. 66-71, Mar. 2005
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Cite this article
[IEEE Style]
Y. Huh, J. S. Kim, S. H. Kim, M. W. Suh, "Characterizing Yarn Thickness Variation by Correlograms," Fibers and Polymers, vol. 6, no. 1, pp. 66-71, 2005. DOI: fipo-2005-6-1-66.
[ACM Style]
You Huh, Jong S. Kim, Sung H. Kim, and M. W. Suh. 2005. Characterizing Yarn Thickness Variation by Correlograms. Fibers and Polymers, 6, 1, (2005), 66-71. DOI: fipo-2005-6-1-66.