Digital Library[ Search Result ]

Search : "[ keyword: Defect localization ]" (1)
Lightweight Deep-Learning for Defect Localization in Air-Jet Textured Yarn from Grayscale Surface-Loop Images
Hyeongmin Moon  Md Morshedur Rahman  Eunho Shin  Ingi Hong  Seunga Choi 
Hyungsup Kim  Chang Kyu Park  Joonseok Koh
Vol. 27, No. 2, pp. 1019-1030, Feb. 2026
10.1007/s12221-025-01268-6

Search
(IN TITLE, AUTHOR, ABSTRACT,KEYWORDS)

Advanced Search ▼

POPULAR KEYWORDS
(TOP 10 KEYWORDS)

Recent Publications
(LAST 3 YEARS)

pISSN : 1229 - 9197
eISSN : 1875 - 0052

Impact Factor(2024): 2.3