Breakdown and Destruction Characteristics of the TTL IC by the Artificial Microwave 


Vol. 22,  No. 5, pp. 26-31, Oct.  2007


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[IEEE Style]

홍주일, 황선묵, 허창수, "Breakdown and Destruction Characteristics of the TTL IC by the Artificial Microwave," Journal of the Korean Society of Safety, vol. 22, no. 5, pp. 26-31, 2007. DOI: .

[ACM Style]

홍주일, 황선묵, and 허창수. 2007. Breakdown and Destruction Characteristics of the TTL IC by the Artificial Microwave. Journal of the Korean Society of Safety, 22, 5, (2007), 26-31. DOI: .