Breakdown and Destruction Characteristics of the TTL IC by the Artificial Microwave
Vol. 22, No. 5, pp. 26-31, Oct. 2007
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Cite this article
[IEEE Style]
홍주일, 황선묵, 허창수, "Breakdown and Destruction Characteristics of the TTL IC by the Artificial Microwave," Journal of the Korean Society of Safety, vol. 22, no. 5, pp. 26-31, 2007. DOI: .
[ACM Style]
홍주일, 황선묵, and 허창수. 2007. Breakdown and Destruction Characteristics of the TTL IC by the Artificial Microwave. Journal of the Korean Society of Safety, 22, 5, (2007), 26-31. DOI: .