The Physical Properties and Structural Changes of Flexible MAPbI3 Thin Films according to the Fabrication Method

The structural analysis is essential for the development of flexible metal-halide perovskite solar cell devices because its performance is critically influenced by the mechanical external stress. Here, we investigated the effect of mechanical stress on metal-halide perovskite films prepared by powder-based method different from conventional precursor solution method. Before studying the effect of the mechanical stress, we confirmed the MAPbI3 powder crystal structure through Rietveld refinement of powder x-ray diffraction data. We fabricated thin films with powder-based method and compared their crystal structures using Grazing Incidence Wide Angle X-ray Scattering (GIWAXS), which showed no significant differences from films based on conventional solution method. To investigate the mechanical stress effect on the perovskite film, we prepared MAPbI3 layer on PEN substrates and compared the crystalline structural changes after bending test. In the case of conventional MAPbI3 layer, intergranular crack was observed, while the transgranular crack was formed in the powder-based MAPbI3 layer after bending test. Finally, we fabricated a solar cell device on the polyethylene naphthalate (PEN) substrate and investigated changes of the J-V characteristics after mechanical stress.

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The Physical Properties and Structural Changes of Flexible MAPbI3 Thin Films according to the Fabrication Method

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