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Inspection of Reed Mark and Yarn Interval on Woven Fabric Surface using Image Analysis and Fourier Transform
김형섭  Akio Sakaguchi  Koichiro Toriumi
Vol. 37, No. 6, pp. 352-357, Jun. 2000

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pISSN : 1225 - 1089
eISSN : 2288 - 6419

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