오류주입공격 실험 정밀도 분석 및 개선지표
Vol. 24, No. 2, pp. 285-294,
4월.
2014
10.13089/JKIISC.2014.24.2.285, Full Text:
Keywords: Digital Forensics, Smartphone Forensics, Android Forensics, Android Application, Android Data Acquisition
Abstract Statistics
Cite this article
10.13089/JKIISC.2014.24.2.285, Full Text:
Keywords: Digital Forensics, Smartphone Forensics, Android Forensics, Android Application, Android Data Acquisition
Abstract Statistics
Cite this article
[IEEE Style]
H. Kim, Y. Kang, Y. Lee, J. Park, C. Kim, H. Lee, "The Study on Fault Injection Attack: The analysis and improvement of the experimental precision indicators," Journal of The Korea Institute of Information Security and Cryptology, vol. 24, no. 2, pp. 285-294, 2014. DOI: 10.13089/JKIISC.2014.24.2.285.
[ACM Style]
HyunHo Kim, Young-Jin Kang, Young-Sil Lee, Jae-Hoon Park, Chang-Kyun Kim, and HoonJae Lee. 2014. The Study on Fault Injection Attack: The analysis and improvement of the experimental precision indicators. Journal of The Korea Institute of Information Security and Cryptology, 24, 2, (2014), 285-294. DOI: 10.13089/JKIISC.2014.24.2.285.