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The Study on Fault Injection Attack: The analysis and improvement of the experimental precision indicators

HyunHo Kim, Young-Jin Kang, Young-Sil Lee, Jae-Hoon Park, Chang-Kyun Kim, HoonJae Lee, Vol. 24, No. 2, pp. 285-294, Apr. 2014

10.13089/JKIISC.2014.24.2.285
Keywords: Digital Forensics, Smartphone Forensics, Android Forensics, Android Application, Android Data Acquisition

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